https://doi.org/10.1140/epjb/e2008-00152-7
Enhanced fluxon transmission through impurities
Bogolyubov Institute for Theoretical Physics, National Academy of Sciences of Ukraine, vul. Metrologichna 14B, 03680 Kyiv, Ukraine
Corresponding author: a This email address is being protected from spambots. You need JavaScript enabled to view it.
Received:
9
December
2007
Revised:
18
March
2008
Published online:
11
April
2008
Abstract
Fluxon transmission through several impurities of different strength and type (i.e., microshorts and microresistors), placed in a long Josephson junction is investigated. Retrapping current on the impurities is computed as a function of the distance between them, their amplitudes and the dissipation parameter. It is shown that in the case of consequently placed microshorts or microresistors, the retrapping current exhibits a clear minimum as a function of the distance between the impurities. In the case of a microresistor, followed by a microshort, an opposite phenomenon is observed, namely the retrapping current exhibits maximum as a function of the distance between the impurities.
PACS: 03.75.Lm – Tunneling, Josephson effect, Bose-Einstein condensates in periodic potentials, solitons, vortices, and topological excitations / 05.45.Yv – Solitons / 74.50.+r – Tunneling phenomena; point contacts, weak links, Josephson effects
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2008
