2017 Impact factor 1.536
Condensed Matter and Complex Systems

EPJ B Special Issue: Non-Linear and Complex Dynamics in Semiconductors and Related Materials

The investigation of nonlinear dynamics and low-dimensional chaos in semiconductors has become a mature field of research over recent decades, with research interests ranging from the multi-facetted carrier dynamics to the sophisticated optical properties in complex materials and devices.

With the motto “Complex Systems Science meets Matter and Materials,” this topical issue of EPJ B aims to take stock of both current and future developments in the field. It will collect theoretical, experimental and computational contributions with the specific goal of
i) Investigating and explaining the fundamental physics behind the dynamical processes occurring at various scales.
ii) Describing the detailed foundations of theoretical and computational modeling
iii) Suggesting future experiments in the field

Guest Editor:

  • Kathy Lüdge, Technische Universität Berlin, Germany, This email address is being protected from spambots. You need JavaScript enabled to view it.

Deadline for submission: December 7, 2018

Submission is now open. Contributions should be submitted to the Editorial Office of EPJ B https://articlestatus.edpsciences.org/is/epjb. Submissions should be clearly identified as intended for the topical issue “Non-linear and complex dynamics in semiconductors and related materials” (use the pull down menu).

If you experience any difficulties with the submission process or for further details and information, please contact the editorial office at This email address is being protected from spambots. You need JavaScript enabled to view it. .
Acting EiC: Wenhui Duan

Executive Editors:
B.K. Chakrabarti, W. Duan, E. Hernandez, H. Rieger
Thank you for the very fruitful and efficient collaboration. It has been a pleasure!!

Paul van Loosdrecht, Guest Editor Topical issue: Excitonic Processes in Condensed Matter, Nanostructured and Molecular Materials, 2013

ISSN (Print Edition): 1434-6028
ISSN (Electronic Edition): 1434-6036

© EDP Sciences, Società Italiana di Fisica and Springer-Verlag