https://doi.org/10.1007/s100510050135
Scaling relationship between effective critical exponents throughout the crossover region in thin Ising films
Departamento de Física de Materiales, C-IV, Universidad Autónoma de Madrid,
28049 Madrid, Spain
Received:
22
April
1999
Published online: 15 March 2000
The Monte Carlo (MC) approach is used to check the validity of the scaling relationship
for the effective critical exponents in thin Ising films.
We investigate this relationship not just in the critical region but throughout the
crossover to the expected two-dimensional behavior. Our results indicate that
this scaling relationship is very well-fulfilled throughout the entire crossover
temperature region, as predicted by a previous renormalization group analysis.
The two-dimensional universality class of Ising films is confirmed by means of data
collapsing plots for 
plates with increasing L, up to L=100.
The evolution of the maximum value of the effective critical exponents with film
thickness is discussed.
PACS: 75.10.Hk – Classical spin models / 64.60.Fr – Equilibrium properties near critical points, critical exponents / 75.70.-i – Magnetic films and multilayers
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2000
