https://doi.org/10.1007/s100510070145
A mechanism for cutting carbon nanotubes with a scanning tunneling microscope
1
Departamento de Física Teórica, Universidad de Valladolid, 47011 Valladolid, Spain
2
Departamento de Física de Materiales, Euskal Herriko Unibertsitatea,
Aptdo. 1072, San Sebastian 20080, Basque Country
and
Donostia International Physics Center, San Sebastian, Spain
3
Department of Applied Physics, Chalmers University of Technology and Göteborg University, 41296
Göteborg, Sweden
4
Department of Applied Sciences and DIMES, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft,
The Netherlands
Received:
6
April
2000
Published online: 15 September 2000
We discuss the local cutting of single-walled carbon nanotubes by
a voltage pulse to the tip of a scanning tunneling microscope. The
tip voltage ( V) is the key physical
quantity in the cutting process. After reviewing several possible
physical mechanisms we conclude that the cutting process relies on
the weakening of the carbon-carbon bonds through a combination of
localized particle-hole excitations induced by inelastically
tunneling electrons and elastic deformation due to the electric
field between tip and sample. The carbon network releases part of
the induced mechanical stress by forming topological defects that
act as nucleation centers for the formation of dislocations that
dynamically propagate towards bond-breaking.
PACS: 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc. / 61.48.+c – Fullerenes and fullerene-related materials / 62.20.Fe – Deformation and plasticity (including yield, ductility, and superplasticity)
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2000