Eur. Phys. J. B 72, 591-596 (2009)
https://doi.org/10.1140/epjb/e2009-00385-x

Dynamical simulations on the two-dimensional XY model with random-phase shift

¹ Center for Statistical and Theoretical Condensed Matter Physics, Zhejiang Normal University, Jinhua, 321004, P.R. China
² Department of Physics, Zhejiang University, Hangzhou, 310027, P.R. China

Corresponding author: ^a qhchen@zju.edu.cn

Received: 21 August 2009
Revised: 5 October 2009
Published online: 10 November 2009

Abstract

Using resistively-shunted-junction dynamics, we numerically investigate the two-dimensional XY model with random phase shift. The critical temperatures and critical exponents are determined by dynamic scaling analysis. For weak disorder strengths, the system undergoes a Kosterlitz-Thouless (KT). A non-KT type phase transition is also observed for strong disorders. A genuine continuous depinning transition at zero temperature and creep motion at low temperature are also studied for various disorder strengths. The relevant critical currents and critical exponents are evaluated, and a non-Arrhenius creep motion is observed in the low temperature phases.