https://doi.org/10.1007/s100510050187
Edison revisited: Electro mechanical effects in wet porous materials
Groupe de Physique des Solides, Universités Paris VI et VII,
2 place Jussieu, 75251 Paris Cedex 05, France
Corresponding author: a mayer@gps.jussieu.fr
Received:
22
July
1997
Revised:
21
October
1997
Accepted:
21
November
1997
Published online: 15 February 1998
Edison discovered that the coefficient of friction between a metallic plate and a porous
material moistened with a dilute electrolyte could be modulated by an electric field.
In experiments on the same kind of contacts (clays or chalks on carbon or metals) but
without continuous tangential relative motion we measure two electro-mechanical effects
at frequencies of the order of 10 kHz.
An alternating field induces an alternating normal force between the porous material and
the conducting base. The force is lagging by
versus the field.
A forced normal relative motion induces through the contact a current nearly in phase with
the motion.
For an explanation we start from Helmholtz theory of stationary electrophoretic
phenomena. We present a model in which liquid motions obey the Helmholtz laws. It
explains decently the phase relations between causes and effects, and approximately the
values of the effects.
In optical experiments on contacts between a wet clay and the transparent conducting
coating of a glass plate we measure in the frequency range 1-100 kHz a modulation of
reflecting power induced by an alternating potential. The decrease of reflecting power is
lagging by an angle close to
behind the field. We think the modulation observed is
induced by a modulation of the amount of liquid in the film present between glass and
clay. In friction experiments this alternating liquid lubrication acting exclusively at the very
places where friction occurs may have significant effect.
PACS: 47.55.Mh – Flows through porous media / 82.45.+z – Electrochemistry and electrophoresis / 46.30.Pa – Friction, wear, adherence, hardness, mechanical contacts, and tribology
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 1998