Eur. Phys. J. B 7, 339-345 (1999)
https://doi.org/10.1007/s100510050620

X-ray scattering by nano-particles within granular thin films, investigation by grazing angle X-ray reflectometry

¹ Laboratoire de Physique de l'État Condensé (CNRS -UPRESA 6087) , Université du Maine, Faculté des Sciences, 72085 Le Mans Cedex 09, France
² Institut d'Optique Théorique & Appliquée, Bâtiment 503, Université Paris-Sud, 91403 Orsay Cedex, France
³ Laboratoire d'Optique des Solides, Université Paris VI, Paris, France
⁴ Laboratoire des Solides Irradiés, École Polytechnique, Palaiseau, France
⁵ Laboratoire Léon Brillouin (CNRS -CEA) , CEA Saclay, 91191 Gif-sur-Yvette Cedex, France

Received: 19 February 1998
Accepted: 25 August 1998
Published online: 15 February 1999

Abstract

It is shown here that the observation of the phenomenon of like small angle scattering of X-rays in very thin heterogeneous films, can be made comparatively easily by using grazing angle reflectometry of X-rays. The feasibility was achieved with co-sputtered thin films of approximately 600 Å thickness, made up by crystalline platinum clusters embedded in an amorphous alumina matrix. The experimental reflectivity profiles are simulated by the intensity superposition of two components: (i) the specular part caused by the usual interference phenomenon between the partial waves reflected from the air-film and film-substrate interfaces, and (ii) the like-small angle scattering part due to diffraction by platinum clusters. It is found that the shape of such clusters is spherical characterized by mean values of diameter and inter-cluster distance of the order 29 Å and 45 Å respectively with standard deviations and of the order of 3 Å . Such an observation of both the interference and diffraction phenomena indicates that the thin granular film exhibits both its continuous and heterogeneous aspects together.