Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts
Corresponding author: a email@example.com
Published online: 15 July 1999
Measurements are presented of the X-ray specular reflectivity and near-specular diffuse scattering of the interface in a near-critical mixture of hexane and perfluorohexane. A lineshape analysis of the scattered intensity at each temperature yields values for the interfacial tension and interfacial width. The temperature variation of the tension and width so-obtained are consistent with current understanding of this interface, which holds that there is, firstly, an intrinsic width over which the fluid density varies smoothly from one coexistence composition to the other, and, secondly, that the interface acquires an additional and larger statistical interfacial width as a result of capillary fluctuations.
PACS: 82.70.Dd – Colloids / 42.25.Kb – Coherence
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 1999