Experimental feasibility of phaseless inverse scattering methods for specular reflectivity
Laboratoire des Matériaux et Procédés Membranaires (UMR 5635 du
CNRS) , 8 rue de l'École Normale, 34296 Montpellier Cedex 5, France
Published online: 15 February 2000
The possibilities for calculating the X-ray or neutron scattering potential across a thin film from experimental specular reflectivity amplitude information alone and using full dynamical theory, i.e., phaseless inverse scattering, are investigated and compared with traditional fitting methods. The feasibility of the method is demonstrated by one trivial and two non-trivial experimental examples. The usefulness, but also the limitations are outlined by the experiments and by numerical examples. The data reduction is treated in some detail and, in particular, a new method is proposed for deconvolving the experimental data from the instrumental smearing function.
PACS: 61.10.Kw – X-ray reflectometry (surfaces, interfaces, films) / 68.35.Ct – Interface structure and roughness / 68.55.Jk – Structure and morphology; thickness
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2000