https://doi.org/10.1007/s100510170331
Stabilisation of fcc cobalt layers by 0.4 nm thick manganese layers in Co/Mn superlattices
1
IPCMS, GEMM , 23, rue du Loess, 67037 Strasbourg, France
2
LURE, Bâtiment 209 D, Centre Universitaire Paris-Sud, 91898 Orsay Cedex, France
3
EMAT-University of Antwerp, Groenenborgerlaan 171, 2020 Antwerpen, Belgium
Corresponding author: a Anny.S.Michel@univ-poitiers.fr
Received:
27
October
1999
Revised:
29
May
2000
Published online: 15 January 2001
Epitaxial Co/Mn multilayers (0.75 to 6 nm Co, 0.4 nm Mn layer thickness) have been grown on mica substrates covered by a (0002) Ru buffer layer. The structural properties of these layers have been studied using X-ray diffraction, nuclear magnetic resonance (NMR), and high resolution transmission electron microscopy (HRTEM). The Co layers, grown as face centred cubic (fcc), were found to be stabilised by the very thin Mn layers. Data obtained using X-ray diffraction and NMR were analysed and found to be in good agreement, while Monte-Carlo simulations were used to interpret the data and calculate the expected diffracted intensity and NMR spectra. The HRTEM data show that the Mn layers give rise to a large strain contrast extending, in the growth direction, over a distance which exceeds the thickness of the Mn layers. The superlattices could be described as having an fcc structure containing randomly located stacking faults with varying densities. The results verify the presence of a dominant, almost perfect phase of fcc stacking, and of a faulted hcp phase, while the number of defects increases with the Co layer thickness.
PACS: 61.10.-i – X-ray diffraction and scattering / 61.16.-d – Electron, ion, and scanning probe microscopy / 61.50.-f – Crystalline state / 64.60.My – Metastable phases
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2001