https://doi.org/10.1140/epjb/e2003-00349-2
Field-domain dynamics in negative-effective-mass terahertz oscillators
1
State Key Laboratory of Functional Materials for Informatics, Shanghai
Institute of Microsystem and Information Technology, Chinese Academy of
Sciences, 865 Changning Road, Shanghai 200050, P.R. China
2
Institute for Microstructural Sciences, National Research Council, Ottawa,
Ontario K1A 0R6, Canada
Corresponding author: a jccao@mail.sim.ac.cn
Received:
18
July
2003
Published online:
23
December
2003
We have theoretically studied electric-field-domain dynamics and current self-oscillations in dc-biased negative-effective-mass (NEM) diodes. The formation and traveling of electric-field domains in the diodes are investigated in detail with a realistic treatment of the scatterings contributions from carrier-impurity, carrier-acoustic phonon, and carrier-optic phonon within the balance-equation theory. The interesting patterns of the spatiotemporal electric-field domains are shown as a gray density plot with the applied bias as a controlling parameter. It is found that, the applied bias could largely influence the current patterns and self-oscillating frequencies, which lie in the THz range for the NEM diode with a submicrometer p-base. The NEM diode may therefore be developed as an electrically tunable THz-frequency oscillator.
PACS: 73.61.Ey – III-V semiconductors / 73.50.Fq – High-field and nonlinear effects / 85.30.Fg – Bulk semiconductor and conductivity oscillation devices (including Hall effect devices, space-charge-limited devices, and Gunn effect devices) / 85.30.De – Semiconductor-device characterization, design, and modeling
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2003