https://doi.org/10.1140/epjb/e2004-00103-4
Noise correction for roughening analysis of magnetic flux profiles in YBa2Cu3O7-x
Division of Physics and Astronomy, Faculty of Sciences,
Vrije Universiteit, De Boelelaan 1081, 1081HV Amsterdam, The
Netherlands
Corresponding author: a welling@nat.vu.nl
Received:
1
July
2003
Revised:
9
February
2004
Published online:
20
April
2004
The presence of experimental noise may greatly reduce
the accuracy of experimentally determined growth and roughness
exponents, which characterize a growing self-affine interface. A
separate determination of the experimental noise enables a
straightforward correction, which we demonstrate on experiments on
the roughening of magnetic flux profiles in the critical state of
YBa2Cu3O7-x thin films. After noise correction, we find
that the magnetic field profile is characterized by a
roughness exponent 
. The growth exponent of the
profiles is 
.
PACS: 05.65.+b – Self-organized systems / 45.70.-n – Granular systems
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2004
