Optical characterization of ferroelectric Bi3.25La0.75Ti3O12 thin films

Z. G. Hu; Z. M. Huang; Y. N. Wu; S. H. Hu; G. S. Wang; J. H. Ma; J. H. Chu

doi:10.1140/epjb/e2004-00136-7

2021 Impact factor 1.398

Condensed Matter and Complex Systems

Eur. Phys. J. B 38, 431-436 (2004)
https://doi.org/10.1140/epjb/e2004-00136-7

Optical characterization of ferroelectric Bi_3.25La_0.75Ti₃O₁₂ thin films

Z. G. Hu^a, Z. M. Huang, Y. N. Wu, S. H. Hu, G. S. Wang, J. H. Ma and J. H. Chu

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai 200083, P.R. China

Corresponding author: ^a zm2hzg@hotmail.com

Received: 10 April 2003
Revised: 25 February 2004
Published online: 28 May 2004

Abstract

Amorphous and crystalline Bi_3.25La_0.75Ti₃O₁₂ (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier's dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

PACS: 78.20.Ci – Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) / 78.66.Nk – Insulators / 78.68.+m – Optical properties of surfaces / 78.40.Ha – Other nonmetallic inorganics

© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2004