https://doi.org/10.1140/epjb/e2004-00186-9
Phenomenological model of nonlinear dielectric losses related to the intrinsic conductivity of dielectrics
Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego
17, 60-179PL Poznań, Poland
Corresponding author: a malecki@rose.man.poznan.pl
Received:
3
November
2003
Published online:
29
June
2004
A phenomenological approach was applied to the dynamics of the intrinsic
electric conductivity of dielectrics in an electric field in order to
analyze its contribution to dielectric losses. The proposed differential
equation contains only two parameters – the effective time of
conductivity decay in an electric field, and
, the time
describing the recovery rate of the conductivity after switching off the
field. The proposed approach predicts a linear dependence of specific conductivity of
dielectrics on the sample thickness, as experimentally confirmed by Du Pont [CITE] for Teflon FEP. The
field and time (or frequency) dependences of intrinsic conductivity and
related dependences of dielectric losses were calculated, analyzed and
illustrated with the published experimental data. The results show that the
discussed contribution in dielectric losses is characterized by two
hyperbolas (instead of one) while the distance between the branches depends
on the intensity of applied electric field.
PACS: 72.20.Ht – High-field and nonlinear effects / 72.80.Sk – Insulators / 77.22.Gm – Dielectric loss and relaxation
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2004