https://doi.org/10.1140/epjb/e2004-00393-4
Diffraction study of the piezoelectric properties of low quartz
1
Laboratoire de Cristallographie et Modélisation des
Matériaux Minéraux et Biologiques, UMR-CNRS-7036,
Université Henri Poincaré – Nancy I, BP 239,
54 506 Vandoeuvre-lès-Nancy Cedex, France
2
LURE, Centre Universitaire Paris-Sud, Bât. 209D, BP 34, 91898 Orsay Cedex, France
Corresponding author: a pierre.fertey@lcm3b.uhp-nancy.fr
Received:
22
September
2004
Published online:
23
December
2004
The effect of a static electric field on the crystal structure of -quartz has been determined by Xray diffraction on single crystals. By
a stroboscopic technique rocking curves are measured quasi simultaneously
for zero field and for two opposite strong fields (28.8 kV/cm) applied in
the direction of the crystallographic a-axis. The relative
intensity-changes
of high order reflections (i.e. sensitive to the core electrons) were measured
and analysed by a least squares method technique. The analysis indicates
that the bond distances Si-O are very little affected by the field, but
both a deformation and a reorientation of the SiO4 tetrahedra are
induced. The model is qualitatively in agreement with the small amplitudes
of the induced polarisation and the piezoelectric coefficients.
PACS: 61.10.Nz – X-ray diffraction / 77.65.-j – Piezoelectricity and electromechanical effects / 77.22.Ej – Polarization and depolarization / 07.85.Qe – Synchrotron radiation instrumentation
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2004