Eur. Phys. J. B 48, 167-171 (2005)
https://doi.org/10.1140/epjb/e2005-00400-4

A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer

¹ Laboratoire de Physique des Matériaux, UMR CNRS 7556, Université Henri Poincaré, BP 239, 54506 Vandoeuvre-lès-Nancy, France
² Institut Laue-Langevin, 6 rue Jules Horowitz, BP 156, 38042 Grenoble Cedex 9, France

Corresponding author: ^a dufour@lpm.u-nancy.fr

Received: 19 July 2005
Published online: 16 December 2005

Abstract

In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film.