https://doi.org/10.1140/epjb/e2005-00400-4
A simple method for the determination of strains in epitaxial films: application to Eu(110) deposited on a Nb(110) buffer
1
Laboratoire de Physique des Matériaux, UMR CNRS 7556, Université
Henri Poincaré, BP 239, 54506 Vandoeuvre-lès-Nancy, France
2
Institut Laue-Langevin, 6 rue Jules Horowitz, BP 156, 38042 Grenoble Cedex 9, France
Corresponding author: a dufour@lpm.u-nancy.fr
Received:
19
July
2005
Published online:
16
December
2005
In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film.
PACS: 75.70.-i – Magnetic properties of thin films, surfaces, and interfaces / 61.10.Nz – X-ray diffraction / 68.55.-a – Thin films structure and morphology
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2005