https://doi.org/10.1140/epjb/e2007-00037-3
BEEM spectra of various Au-Si samples and their analysis
Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, 91405 Orsay Cedex, France
Corresponding author: a thiaville@lps.u-psud.fr
Received:
15
September
2006
Published online:
7
February
2007
Ballistic electron emision microscopy spectra have been measured at room temperature on Au films deposited on the Si(111)-H surface by different procedures. In order to analyze them in detail, we propose a fully analytical description of these spectra, directly based on the phase-space model of Bell and Kaiser. This allows fitting experimental data over a wide voltage range, comprising the threshold and the quasi-linear regions. Two main independent parameters are extracted from the fits, namely the effective Schottky barrier height and hot-electron transmission of the sample. These show a clear variation with sample preparation conditions.
PACS: 68.37.Uv – Near-field scanning microscopy and spectroscopy / 73.40.Qv – Metal-insulator-semiconductor structures (including semiconductor-to-insulator) / 72.15.-v – Electronic conduction in metals and alloys
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2007
