https://doi.org/10.1140/epjb/e2008-00010-8
Scaling and self-similarity in Pb1-xFexS nanoparticle films
Department of Physics, Indian Institute of Technology, Hauz Khas, New Delhi, 110016, India
Corresponding author: a varsha@physics.iitd.ernet.in
Received:
18
June
2007
Revised:
15
November
2007
Published online:
16
January
2008
This paper addresses the issues of scaling and self-similarity in typical nanoparticle films. The role played by microscopic processes contributing to growth on these issues is probed. While we perform this investigation for a specific system viz., Pb1-xFexS nanoparticle films for clarity of the procedures, the analysis is general and can be applied to a variety of systems obtained using different deposition techniques.
PACS: 61.43.Hv – Fractals; macroscopic aggregates / 68.55.A – Nucleation and growth: microscopic aspects / 68.55.J – Structure and morphology; thickness; crystalline orientation and texture
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2008
