https://doi.org/10.1140/epjb/e2008-00459-3
Shubnikov-de Haas oscillations spectrum of the strongly correlated quasi-2D organic metal (ET)8[Hg4Cl12(C6H5Br)2] under pressure
1
Laboratoire National des Champs Magnétiques Pulsés (UMR 5147: Unité Mixte de Recherche CNRS, Université Paul Sabatier, INSA de Toulouse, France. ) , 143 avenue de Rangueil, 31400 Toulouse, France
2
Institute of Problems of Chemical Physics, RAS, 142432 Chernogolovka, MD, Russia
3
Institut de Ciència de Materials de Barcelona, CSIC, Campus de la UAB, 08193, Bellaterra, Spain
Corresponding author: a audouard@lncmp.org
Received:
21
October
2008
Revised:
24
November
2008
Published online:
18
December
2008
Pressure dependence of the Shubnikov-de Haas (SdH) oscillations spectra of the quasi-two dimensional organic metal (ET)8[ Hg4Cl12(C6H5Br)2] have been studied up to 1.1 GPa in pulsed magnetic fields of up to 54 T. According to band structure calculations, its Fermi surface can be regarded as a network of compensated orbits. The SdH spectra exhibit many Fourier components typical of such a network, most of them being forbidden in the framework of the semiclassical model. Their amplitude remains large in all the pressure range studied which likely rules out chemical potential oscillation as a dominant contribution to their origin, in agreement with recent calculations relevant to compensated Fermi liquids. In addition to a strong decrease of the magnetic breakdown field and effective masses, the latter being likely due to a reduction of the strength of electron correlations, a sizeable increase of the scattering rate is observed as the applied pressure increases. This latter point, which is at variance with data of most charge transfer salts is discussed in connection with pressure-induced features of the temperature dependence of the zero-field interlayer resistance.
PACS: 71.18.+y – Fermi surface: calculations and measurements; effective mass, g factor / 71.20.Rv – Polymers and organic compounds / 72.15.Gd – Galvanomagnetic and other magnetotransport effects
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2008