https://doi.org/10.1140/epjb/e2009-00270-8
Single scattering profile from small-angle scattering data affected by multiple scattering: use of a basis function set
Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai, 400 085, India
Corresponding author: a debasis@barc.gov.in
Received:
20
April
2009
Revised:
11
June
2009
Published online:
24
July
2009
Present work involves extraction of single-scattering profile from small-angle scattering data, affected by multiple scattering, using an existing model-independent algorithm [Mazumder et al., Physica B 241–243, 1222 (1998), Mazumder et al., J. Appl. Crystallogr. 36, 840 (2003)]. It is shown that implementation of the algorithm becomes effective by representing the multiple scattering profiles in terms of a set of basis function whose form of Hankel transformed pair is known analytically. In the present paper, the methodology has been presented by introducing a Gaussian basis set and has been tested for various simulated profiles. The performance of this methodology has also been tested for scattering profiles having complex internal features and moderate statistical noise. Subsequently, the same has been applied for experimental small-angle neutron scattering data.
PACS: 61.05.cf – X-ray scattering (including small-angle scattering) / 61.05.fg – Neutron scattering (including small-angle scattering) / 11.80.La – Multiple scattering
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2009
