Eur. Phys. J. B 79, 153-162 (2011)
https://doi.org/10.1140/epjb/e2010-10051-y

Investigation of Cu_0.5Ni_0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

¹ Institute of Physics, Academia Sinica, 115 Taipei, Taiwan, Republic of China
² Institute of Electrophysics, National Chiao Tung University, 300 Hsinchu, Taiwan, Republic of China
³ Department of Physics, Fu Jen University, 242 Taipei, Taiwan, Republic of China

Corresponding authors: ^a phys2021@mails.fju.edu.tw - ^b leesf@phys.sinica.edu.tw

Received: 18 January 2010
Revised: 22 June 2010
Published online: 6 January 2011

Abstract

A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu_0.5Ni_0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.