Eur. Phys. J. B (2013) 86: 187
https://doi.org/10.1140/epjb/e2013-30591-8

Regular Article

X-ray irradiation effect of double walled carbon nanotube^*

¹ Department of Material Science, Wakayama University, 640-8510 Wakayama, Japan
² Department of Physics, Wakayama University, 640-8510 Wakayama, Japan

^a e-mail: murakami@sys.wakayama-u.ac.jp

Received: 13 July 2012
Received in final form: 29 December 2012
Published online: 24 April 2013

Abstract

We have studied double-walled carbon nanotube (DWNT) irradiated by soft X-ray by Raman scattering spectroscopy and the spectral characteristics are compared to single-walled carbon nanotube (SWNT) irradiated under the same condition. We proved that DWNT is more stable for the X-ray induced defect formation than SWNT. Moreover, we found that the outer tube of DWNT was more sensitive on X-ray irradiation than the inner tube. The defect was recovered by annealing in Ar at lower temperature than that of SWNT. Based on these results, we inferred that X-ray irradiation leads to formation of interstitial-vacancy pairs, Frenkel defects, in carbon nanotube. The interstitial-vacancy separation on the inner tube of DWNT is conceivably shorter than that of the outer tube.