https://doi.org/10.1140/epjb/e2013-30591-8
Regular Article
X-ray irradiation effect of double walled carbon nanotube*
1
Department of Material Science, Wakayama University,
640-8510
Wakayama,
Japan
2
Department of Physics, Wakayama University,
640-8510
Wakayama,
Japan
a
e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.
Received: 13 July 2012
Received in final form: 29 December 2012
Published online: 24 April 2013
Abstract
We have studied double-walled carbon nanotube (DWNT) irradiated by soft X-ray by Raman scattering spectroscopy and the spectral characteristics are compared to single-walled carbon nanotube (SWNT) irradiated under the same condition. We proved that DWNT is more stable for the X-ray induced defect formation than SWNT. Moreover, we found that the outer tube of DWNT was more sensitive on X-ray irradiation than the inner tube. The defect was recovered by annealing in Ar at lower temperature than that of SWNT. Based on these results, we inferred that X-ray irradiation leads to formation of interstitial-vacancy pairs, Frenkel defects, in carbon nanotube. The interstitial-vacancy separation on the inner tube of DWNT is conceivably shorter than that of the outer tube.
Contribution to the Topical Issue “Excitonic Processes in Condensed Matter, Nanostructured and Molecular Materials”, edited by Maria Antonietta Loi, Jasper Knoester and Paul H. M. van Loosdrecht.
© EDP Sciences, Società Italiana di Fisica and Springer-Verlag, 2013
