https://doi.org/10.1140/epjb/e2006-00012-6
Ion-beam induced changes in magnetic and microstructural properties of thin iron films
II. Physikalisches Institut and Sonderforschungsbereich 602,
Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen,
Germany
Corresponding author: a plieb@gwdg.de
Received:
8
July
2005
Revised:
20
October
2005
Published online:
19
January
2006
Changes in magnetic and structural properties of 60–82 nm iron films induced by heavy-ion implantation were studied using the magneto-optical Kerr effect, Mössbauer spectroscopy, Rutherford backscattering spectroscopy, X-ray diffraction, and X-ray absorption fine structure. The influence of ion-beam parameters (ion mass, fluence) and of sample parameters (external magnetic field and stress during implantation) were investigated. The Fe films, some of them containing a thin 57Fe marker layer for Mössbauer spectroscopy, were deposited on Si(100) substrates, by electron-beam and effusion-cell evaporation. The films were irradiated with 20Ne, 56Fe, 86Kr and 132Xe ions at energies chosen so that the implantation profiles peaked near the middle of the Fe films. The as-deposited films were magnetically isotropic and had a high coercivity. After ion implantation, the coercivity decreased and magnetic anisotropy developed. Both changes correlated with a decrease in the internal film stress. External mechanical stress applied during the irradiation had hardly any influence on the magnetic texture, opposite to an external magnetic field applied during or before ion implantation. The results are compared with those obtained for ion-irradiated polycrystalline Ni films and epitaxial Fe films and discussed with respect to the role of radiation-induced extended defects as pinning centers.
PACS: 61.72.-y – Defects and impurities in crystals; microstructure / 61.82.Bg – Metals and alloys / 68.55.Ln – Defects and impurities: doping, implantation, distribution, concentration, etc. / 75.30.Gw – Magnetic anisotropy / 75.50.Bb – Fe and its alloys
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag, 2006