EPJ Web of Conferences Highlight – 22nd International Metrology Congress (CIM2025)

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Published on 16 April 2025

The 22^nd International Metrology Congress, organized by the College Français de Métrologie, took place in Lyon, France, from 11–14 March 2025 in partnership with the Global Industrie exhibition. The conference hosted roughly 500 registered participants from 40 different countries.

The first International Metrology Congress (CIM) was organized in Bordeaux in 1983 by Pierre Barbier, a renowned metrology expert and founder of the Collège Français de Métrologie (CFM). The event was created to provide a platform for experts and practitioners in the field of metrology to exchange views on technical challenges, developments in standardization and emerging innovations.

In its successive editions, CIM has attracted participants from around the world, including representatives from industry, academia and regulatory bodies.

Today, CIM is a premier biennial event that attracts hundreds of professionals who take advantage of the opportunity to interact with leading metrology experts. For its 22^nd edition, 180 presentations were given within 18 oral sessions, 2 posters sessions, 5 round-table, a plenary. Major topics were addressed: measurement data management, machine learning, sustainability, standards updates… A Metrology Village was created in conjunction with the congress counting 60 exhibitors on 1000 m².