https://doi.org/10.1140/epjb/e2019-100137-7
Regular Article
The structural transition under densification and the relationship between structure and density of silica glass
1
Department of Computational Physics, Hanoi University of Science and Technology,
Hanoi, Viet Nam
2
Simulation in Materials Science Research Group, Advanced Institute of Materials Science, Ton Duc Thang University,
Ho Chi Minh City, Viet Nam
3
Faculty of Electrical and Electronics Engineering, Ton Duc Thang University,
Ho Chi Minh City, Viet Nam
4
Institute of Applied Materials Science, Vietnam Academy of Science and Technology,
No. 1A TL29 Str., Thanh Loc Ward, District 12,
Ho Chi Minh City, Viet Nam
5
Thu Dau Mot University,
Binh Duong Province, Viet Nam
6
Institute of Research and Development, Duy Tan University,
Da Nang
550000, Viet Nam
a e-mail: lethevinh@tdtu.edu.vn
Received:
8
March
2019
Received in final form:
2
June
2019
Published online: 26 August 2019
The structure of silica glass (SiO2) at different densities and at temperatures of 500 K is investigated by molecular dynamics simulation. Results reveal that at density of 3.317 g/cm3, the structure of silica glass mainly comprises two phases: SiO4- and SiO5-phases. With the increase of density, the structure tends to transform from SiO4-phase into SiO6-phase. At density of 3.582 g/cm3, the structure comprises three phases: SiO4- , SiO5-, and SiO6-phases, however, the SiO5- phase is dominant. At higher density (3.994 g/cm3), the structure mainly consists of two main phases: SiO5- and SiO6-phases. In the SiO4-phase, the SiO4 units mainly link to each other via corner-sharing bonds. In the SiO5-phase, the SiO5 units link to each other via both corner- and edge-sharing bonds. For SiO6-phase, the SiO6 units can link to each other via corner-, edge-, and face-sharing bonds. The SiO4-, SiO5-, and SiO6-phases form SiO4- SiO5- and SiO6-grains respectively and they are not distributed uniformly in model. This results in the polymorphism in the silica glass at high density.
Key words: Computational Methods
© EDP Sciences / Società Italiana di Fisica / Springer-Verlag GmbH Germany, part of Springer Nature, 2019